Structural and Electrical Properties of ZnO Nanorods and Ti Buffer Layers
SCIE
SCOPUS
- Title
- Structural and Electrical Properties of ZnO Nanorods and Ti Buffer Layers
- Authors
- Kwak, CH; Kim, BH; Park, CI; Seo, SY; Kim, SH; Han, SW
- Date Issued
- 2010-02-01
- Publisher
- AMERICAN INSTITUTE OF PYSICS
- Abstract
- Vertically-well-aligned ZnO nanorods were synthesized on Ti buffer layers by a metal-organic chemical-vapor deposition process. Structural analyses demonstrated that the ZnO nanorods were well-aligned in the c-axis and ab-plane. Transmission electron microscopy (TEM) showed that the Ti buffer layer was amorphous and interdiffused into the ZnO nanorods. Energy-dispersive spectroscopy (EDS) analysis revealed the Ti buffer layers to be slightly oxide. Extended x-ray absorption fine structure confirmed the TEM and EDS results. The I-V characteristic measurements showed a 20-fold increase in current density with the Ti buffer layer, suggesting excellent electrical contact between the Ti buffer layer and ZnO nanorods.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/9709
- DOI
- 10.1063/1.3308498
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 96, no. 51908, 2010-02-01
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