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Cited 81 time in webofscience Cited 83 time in scopus
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Direct observation of liquid crystals using cryo‐TEM: Specimen preparation and low‐dose imaging SCIE SCOPUS

Title
Direct observation of liquid crystals using cryo‐TEM: Specimen preparation and low‐dose imaging
Authors
Gao, M.KIM, YOUNGKIZhang, C.Borshch, V.Zhou, S.Park, H. -S.Jakli, A.Lavrentovich, O. D.Tamba, M. -G.Kohlmeier, A.Mehl, G. H.Weissflog, W.Studer, D.Zuber, B.Gnagi, H.Lin, F.
Date Issued
2014-10
Publisher
Wiley
Abstract
Liquid crystals (LCs) represent a challenging group of materials for direct transmission electron microscopy (TEM) studies due to the complications in specimen preparation and the severe radiation damage. In this paper, we summarize a series of specimen preparation methods, including thin film and cryo-sectioning approaches, as a comprehensive toolset enabling high-resolution direct cryo-TEM observation of a broad range of LCs. We also present comparative analysis using cryo-TEM and replica freeze-fracture TEM on both thermotropic and lyotropic LCs. In addition to the revisits of previous practices, some new concepts are introduced, e.g., suspended thermotropic LC thin films, combined high-pressure freezing and cryo-sectioning of lyotropic LCs, and the complementary applications of direct TEM and indirect replica TEM techniques. The significance of subnanometer resolution cryo-TEM observation is demonstrated in a few important issues in LC studies, including providing direct evidences for the existence of nanoscale smectic domains in nematic bent-core thermotropic LCs, comprehensive understanding of the twist-bend nematic phase, and probing the packing of columnar aggregates in lyotropic chromonic LCs. Direct TEM observation opens ways to a variety of TEM techniques, suggesting that TEM (replica, cryo, and in situ techniques), in general, may be a promising part of the solution to the lack of effective structural probe at the molecular scale in LC studies. Microsc. Res. Tech. 77:754-772, 2014. (c) 2014 Wiley Periodicals, Inc.
URI
https://oasis.postech.ac.kr/handle/2014.oak/99502
DOI
10.1002/jemt.22397
ISSN
1097-0029
Article Type
Article
Citation
Microscopy research and technique, vol. 77, no. 10, page. 754 - 772, 2014-10
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