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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백창기 | - |
| dc.date.accessioned | 2018-05-24T10:56:32Z | - |
| dc.date.available | 2018-05-24T10:56:32Z | - |
| dc.date.created | 2017-02-18 | - |
| dc.date.issued | 2014-10-27 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49243 | - |
| dc.publisher | NVMTS | - |
| dc.relation.isPartOf | 2014 Non-Volatile Memory Technology Symposium | - |
| dc.title | The Temperature Dependence of Threshold Voltage Variations due to Oblique Sing Grain Boundary in 3D NAND unit Cells | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2014 Non-Volatile Memory Technology Symposium | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2014 Non-Volatile Memory Technology Symposium | - |
| dc.contributor.affiliatedAuthor | 백창기 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 백창기BAEK, CHANG KI
- Dept. Convergence IT Engineering