The Temperature Dependence of Threshold Voltage Variations due to Oblique Sing Grain Boundary in 3D NAND unit Cells
- Title
- The Temperature Dependence of Threshold Voltage Variations due to Oblique Sing Grain Boundary in 3D NAND unit Cells
- Authors
- 백창기
- Date Issued
- 2014-10-27
- Publisher
- NVMTS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/49243
- Article Type
- Conference
- Citation
- 2014 Non-Volatile Memory Technology Symposium, 2014-10-27
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- There are no files associated with this item.
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