A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution
SCIE
SCOPUS
- Title
- A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution
- Authors
- Aslam, Muhammad; Arif, Osama H.; Jun, Chi-Hyuck
- Date Issued
- 2017-10
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Abstract
- In this paper, a new control chart using sudden death testing is designed by assuming that the lifetime/failure time of the product follows the Weibull distribution. The structure of the proposed chart is presented. The control chart coefficient is determined using some specified average run length for the in control process and the shifted process. Simulation study is given for the illustration purpose.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/50478
- DOI
- 10.1109/ACCESS.2017.2764953
- ISSN
- 2169-3536
- Article Type
- Article
- Citation
- IEEE Access, vol. 5, page. 23358 - 23365, 2017-10
- Files in This Item:
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