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dc.contributor.author김재준-
dc.contributor.authorRahul Rao-
dc.contributor.authorJeremy Schaub-
dc.contributor.authorAmlan Ghosh-
dc.contributor.authorAditya Bansal-
dc.contributor.authorKai Zhao-
dc.contributor.authorBarry Linder-
dc.contributor.authorJames Stathis-
dc.date.accessioned2018-06-18T10:30:36Z-
dc.date.available2018-06-18T10:30:36Z-
dc.date.created2014-03-09-
dc.date.issued2011-06-17-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/66320-
dc.publisherIEEE-
dc.relation.isPartOfSymposium on VLSI Circuits-
dc.relation.isPartOfPROCEEDING OF VLSI SYMPOSIUM-
dc.titlePBTI/NBTI Monitoring Ring Oscillator Circuits with On-Chip Vt Characterization and High Frequency AC Stress Capability-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationSymposium on VLSI Circuits, pp.224 - 225-
dc.citation.conferenceDate2011-06-13-
dc.citation.endPage225-
dc.citation.startPage224-
dc.citation.titleSymposium on VLSI Circuits-
dc.contributor.affiliatedAuthor김재준-
dc.description.journalClass1-
dc.description.journalClass1-

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김재준KIM, JAE JOON
Dept. Convergence IT Engineering
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