Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
PBTI/NBTI Monitoring Ring Oscillator Circuits with On-Chip Vt Characterization and High Frequency AC Stress Capability
- Title
- PBTI/NBTI Monitoring Ring Oscillator Circuits with On-Chip Vt Characterization and High Frequency AC Stress Capability
- Authors
- 김재준; Rahul Rao; Jeremy Schaub; Amlan Ghosh; Aditya Bansal; Kai Zhao; Barry Linder; James Stathis
- Date Issued
- 2011-06-17
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- Symposium on VLSI Circuits, page. 224 - 225, 2011-06-17
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 김재준KIM, JAE JOON
- Dept. Convergence IT Engineering