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Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies
- Title
- Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies
- Authors
- 김재준; Barry Linder; Rahul Rao; Tae-Hyoung Kim; Pong-Fei Lu; Keith Jenkins; Chris H Kim; Aditya Bansal; Saibal Mukhopadyay; Ching-Te Chuang
- Date Issued
- 2011-04-10
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE International Reliability Physics Symposium (IRPS), page. 4.1 - 4.4, 2011-04-10
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Related Researcher
- 김재준KIM, JAE JOON
- Dept. Convergence IT Engineering